"Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 ..."

Hiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai (2010)

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DOI: 10.1587/TRANSELE.E93.C.678

access: closed

type: Journal Article

metadata version: 2020-04-11

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Hiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai:
Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs. IEICE Trans. Electron. 93-C(5): 678-684 (2010)

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