"MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test ..."

DongSup Song et al. (2008)

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DOI: 10.1093/IETISY/E91-D.4.1197

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type: Journal Article

metadata version: 2024-07-15

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DongSup Song, Jin-Ho Ahn, Taejin Kim, Sungho Kang:
MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs. IEICE Trans. Inf. Syst. 91-D(4): 1197-1200 (2008)

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