"Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level ..."

Liao Wang, Masanori Hashimoto (2019)

> Home

Details and statistics

DOI: 10.1587/TRANSELE.2018CDP0004

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/WangH19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/WangH19
Liao Wang, Masanori Hashimoto:
Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate. IEICE Trans. Electron. 102-C(4): 296-302 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.