"Testing of k-FR Circuits under Highly Observable Condition."

Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita (1995)

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DOI: —

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type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/WenTK95
Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita:
Testing of k-FR Circuits under Highly Observable Condition. IEICE Trans. Inf. Syst. 78-D(7): 830-838 (1995)

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