"Design and Optimization of Transparency-Based TAM for SoC Test."

Tomokazu Yoneda et al. (2010)

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DOI: 10.1587/TRANSINF.E93.D.1549

access: closed

type: Journal Article

metadata version: 2020-04-11

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Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara:
Design and Optimization of Transparency-Based TAM for SoC Test. IEICE Trans. Inf. Syst. 93-D(6): 1549-1559 (2010)

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