"A Study for Testability of Redundant Faults in Combinational Circuits ..."

Xiangqiu Yu, Hiroshi Takahashi, Yuzo Takamatsu (1995)

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DOI: —

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type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/YuTT95
Xiangqiu Yu, Hiroshi Takahashi, Yuzo Takamatsu:
A Study for Testability of Redundant Faults in Combinational Circuits Using Delay Effects. IEICE Trans. Inf. Syst. 78-D(7): 822-829 (1995)

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