"Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs."

Ivica Manic et al. (2008)

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DOI: 10.1049/IET-CDS:20070173

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/iet-cds/ManicDDDGS08
Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Danijel Dankovic, Snezana Golubovic, Ninoslav Stojadinovic:
Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs. IET Circuits Devices Syst. 2(2): 213-221 (2008)

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