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"Interface trap charges associated reliability analysis of Si/Ge ..."
Suruchi Sharma, Rikmantra Basu, Baljit Kaur (2021)
- Suruchi Sharma, Rikmantra Basu, Baljit Kaur:
Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET. IET Circuits Devices Syst. 15(5): 424-433 (2021)
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