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"All-digital built-in self-test scheme for charge-pump phase-locked loops."

Lanhua Xia, Jifei Tang (2021)

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DOI: 10.1049/CDS2.12000

access: open

type: Journal Article

metadata version: 2022-10-24

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Lanhua Xia, Jifei Tang:
All-digital built-in self-test scheme for charge-pump phase-locked loops. IET Circuits Devices Syst. 15(1): 1-10 (2021)

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