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"Improving high-level and gate-level testing with FATE: A functional ..."

Giuseppe Di Guglielmo et al. (2007)

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DOI: 10.1049/IET-CDT:20060139

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/GuglielmoFMP07
Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli:
Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM. IET Comput. Digit. Tech. 1(3): 187-196 (2007)

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