"Hardware accelerated constrained random test generation."

Bhaskar Pal et al. (2007)

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DOI: 10.1049/IET-CDT:20070016

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type: Journal Article

metadata version: 2022-11-07

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Bhaskar Pal, Arnab Sinha, Pallab Dasgupta, P. P. Chakrabarti, Kaushik De:
Hardware accelerated constrained random test generation. IET Comput. Digit. Tech. 1(4): 423-433 (2007)

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