"Defect detection while setting up an assembly line - analytical approach ..."

Malolan Sundararaman (2025)

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DOI: 10.1504/IJAOM.2025.145209

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type: Journal Article

metadata version: 2025-07-04

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Malolan Sundararaman:
Defect detection while setting up an assembly line - analytical approach to reduce the N-dimensional solution space. Int. J. Adv. Oper. Manag. 16(1): 109-134 (2025)

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