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"Programmer-guided reliability for extreme-scale applications."

David E. Bernholdt et al. (2018)

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DOI: 10.1177/1094342016667625

access: closed

type: Journal Article

metadata version: 2023-08-28

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  - https://dblp.org/rec/journals/ijhpca/BernholdtEKLM18
David E. Bernholdt, Wael R. Elwasif, Christos Kartsaklis, Seyong Lee, Tiffany M. Mintz:
Programmer-guided reliability for extreme-scale applications. Int. J. High Perform. Comput. Appl. 32(5): 598-612 (2018)

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