"Perception-Based Analysis of Engineering Experiments in the Semiconductor ..."

Mark Last, Abraham Kandel (2002)

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DOI: 10.1142/S0219467802000512

access: closed

type: Journal Article

metadata version: 2020-03-24

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Mark Last, Abraham Kandel:
Perception-Based Analysis of Engineering Experiments in the Semiconductor Industry. Int. J. Image Graph. 2(1): 107-126 (2002)

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