"Highly stable soft-error immune SRAM with multi-node upset recovery for ..."

Na Bai et al. (2023)

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DOI: 10.1016/J.VLSI.2023.05.001

access: closed

type: Journal Article

metadata version: 2024-10-02

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Na Bai, Yueliang Zhou, Yaohua Xu, Yi Wang, Zihan Chen:
Highly stable soft-error immune SRAM with multi-node upset recovery for aerospace applications. Integr. 92: 58-65 (2023)

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