"Serial diagnostic fault simulation for synchronous sequential circuits."

Shung-Chih Chen, Jer-Min Jou (1997)

Details and statistics

DOI: 10.1016/S0167-9260(97)00020-5

access: closed

type: Journal Article

metadata version: 2020-02-20

a service of  Schloss Dagstuhl - Leibniz Center for Informatics