"Detection of counterfeited ICs via on-chip sensor and post-fabrication ..."

Taeyoung Kim et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2018.05.002

access: closed

type: Journal Article

metadata version: 2021-02-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/KimTCS18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/KimTCS18
Taeyoung Kim, Sheldon X.-D. Tan, Chase Cook, Zeyu Sun:
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy. Integr. 63: 31-40 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.