"On the identification of modular test requirements for low cost ..."

Yiorgos Makris, Alex Orailoglu (2007)

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DOI: 10.1016/J.VLSI.2006.01.002

access: closed

type: Journal Article

metadata version: 2021-04-09

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Yiorgos Makris, Alex Orailoglu:
On the identification of modular test requirements for low cost hierarchical test path construction. Integr. 40(3): 315-325 (2007)

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