"On-line testing for VLSI: state of the art and trends."

Michael Nicolaidis (1998)

> Home

Details and statistics

DOI: 10.1016/S0167-9260(98)00028-5

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/Nicolaidis98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/Nicolaidis98
Michael Nicolaidis:
On-line testing for VLSI: state of the art and trends. Integr. 26(1-2): 197-209 (1998)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.