"An efficient SRAM yield analysis method based on scaled-sigma adaptive ..."

Liang Pang et al. (2023)

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DOI: 10.1016/J.VLSI.2022.11.015

access: closed

type: Journal Article

metadata version: 2025-02-05

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Liang Pang, Ziqi Wang, Rui Shi, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi:
An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated. Integr. 89: 155-167 (2023)

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