"Design of a soft error resilient 13T SRAM architecture for radiation-prone ..."

Anish Paul, Siya Sharma, Kulbhushan Sharma (2026)

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DOI: 10.1016/J.VLSI.2025.102574

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type: Journal Article

metadata version: 2025-12-07

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Anish Paul, Siya Sharma, Kulbhushan Sharma:
Design of a soft error resilient 13T SRAM architecture for radiation-prone environments in FinFET 18 nm technology. Integr. 106: 102574 (2026)

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