"Scaling equations for the accurate prediction of CMOS device performance ..."

Aaron Stillmaker, Bevan M. Baas (2017)

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DOI: 10.1016/J.VLSI.2017.02.002

access: closed

type: Journal Article

metadata version: 2020-02-20

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Aaron Stillmaker, Bevan M. Baas:
Scaling equations for the accurate prediction of CMOS device performance from 180 nm to 7 nm. Integr. 58: 74-81 (2017)

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