"A new scheme of test data compression based on equal-run-length coding (ERLC)."

Wenfa Zhan, Aiman El-Maleh (2012)

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DOI: 10.1016/J.VLSI.2011.05.001

access: closed

type: Journal Article

metadata version: 2021-10-14

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Wenfa Zhan, Aiman El-Maleh:
A new scheme of test data compression based on equal-run-length coding (ERLC). Integr. 45(1): 91-98 (2012)

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