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"WDP-BNN: Efficient wafer defect pattern classification via binarized ..."
Qing Zhang et al. (2022)
- Qing Zhang, Yuhang Zhang, Jizuo Li, Yongfu Li:
WDP-BNN: Efficient wafer defect pattern classification via binarized neural network. Integr. 85: 76-86 (2022)
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