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"Test and Design-for-Testability Solutions for 3D Integrated Circuits."

Krishnendu Chakrabarty et al. (2014)

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DOI: 10.2197/IPSJTSLDM.7.56

access: closed

type: Journal Article

metadata version: 2023-03-09

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  - https://dblp.org/rec/journals/ipsj/ChakrabartyADNWY14
Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye:
Test and Design-for-Testability Solutions for 3D Integrated Circuits. IPSJ Trans. Syst. LSI Des. Methodol. 7: 56-73 (2014)

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