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"Delay Testing: Improving Test Quality and Avoiding Over-testing."

Seiji Kajihara, Satoshi Ohtake, Tomokazu Yoneda (2011)

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DOI: 10.2197/IPSJTSLDM.4.117

access: closed

type: Journal Article

metadata version: 2020-09-29

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Seiji Kajihara, Satoshi Ohtake, Tomokazu Yoneda:
Delay Testing: Improving Test Quality and Avoiding Over-testing. IPSJ Trans. Syst. LSI Des. Methodol. 4: 117-130 (2011)

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