"Unlocking the power of knowledge for few-shot fault diagnosis: A review ..."

Pei Lai et al. (2025)

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DOI: 10.1016/J.INS.2025.121996

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type: Journal Article

metadata version: 2025-04-08

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Pei Lai, Fan Zhang, Tianrui Li, Jin Guo, Fei Teng:
Unlocking the power of knowledge for few-shot fault diagnosis: A review from a knowledge perspective. Inf. Sci. 706: 121996 (2025)

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