"Fault Modeling and Testing for Analog Circuits in Complex Space Based on ..."

Hongzhi Hu, Shulin Tian, Qing Guo (2015)

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DOI: 10.1155/2015/851837

access: open

type: Journal Article

metadata version: 2020-07-16

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Hongzhi Hu, Shulin Tian, Qing Guo:
Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. J. Appl. Math. 2015: 851837:1-851837:9 (2015)

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