"One size does not fit all: A study of badge behavior in stack overflow."

Stav Yanovsky et al. (2021)

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DOI: 10.1002/ASI.24409

access: closed

type: Journal Article

metadata version: 2022-01-03

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Stav Yanovsky, Nicholas Hoernle, Omer Lev, Kobi Gal:
One size does not fit all: A study of badge behavior in stack overflow. J. Assoc. Inf. Sci. Technol. 72(3): 331-345 (2021)

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