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"Bilayer Markov Random Field Method for Detecting Defects in Patterned Fabric."

Xingzhi Chang et al. (2022)

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DOI: 10.1142/S021812662250058X

access: closed

type: Journal Article

metadata version: 2024-03-12

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  dblp key:
  - journals/jcsc/ChangLZZG22
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  persistent URL:
  - https://dblp.org/rec/journals/jcsc/ChangLZZG22
Xingzhi Chang, Wei Liu, Chuan Zhu, Xiaohua Zou, Guan Gui:
Bilayer Markov Random Field Method for Detecting Defects in Patterned Fabric. J. Circuits Syst. Comput. 31(3): 2250058:1-2250058:24 (2022)

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