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"Thermal Reliability of a CMOS-OTA Versus Improving Its Parameters."

Hassan Fathabadi (2021)

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DOI: 10.1142/S0218126621501711

access: closed

type: Journal Article

metadata version: 2021-09-09

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  - https://dblp.org/rec/journals/jcsc/Fathabadi21
Hassan Fathabadi:
Thermal Reliability of a CMOS-OTA Versus Improving Its Parameters. J. Circuits Syst. Comput. 30(10): 2150171:1-2150171:16 (2021)

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