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"Investigation of Intermittent Resistive Faults in Digital CMOS Circuits."

Hans G. Kerkhoff, Hassan Ebrahimi (2016)

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DOI: 10.1142/S0218126616400235

access: closed

type: Journal Article

metadata version: 2020-08-25

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  - https://dblp.org/rec/journals/jcsc/KerkhoffE16
Hans G. Kerkhoff, Hassan Ebrahimi:
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. J. Circuits Syst. Comput. 25(3): 1640023:1-1640023:17 (2016)

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