"MI-YOLO: more information based YOLO for insulator defect detection."

Shengyang Luan et al. (2023)

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DOI: 10.1117/1.JEI.32.4.043014

access: closed

type: Journal Article

metadata version: 2024-11-28

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Shengyang Luan, Chunlei Li, Peng Xu, Yaokun Huang, Xiaoyan Wang:
MI-YOLO: more information based YOLO for insulator defect detection. J. Electronic Imaging 32(4) (2023)

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