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"Test-time adaptation via self-training with future information."

Xin Wen, Hao Shen, Zhongqiu Zhao (2024)

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DOI: 10.1117/1.JEI.33.3.033012

access: closed

type: Journal Article

metadata version: 2024-05-31

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Xin Wen, Hao Shen, Zhongqiu Zhao:
Test-time adaptation via self-training with future information. J. Electronic Imaging 33(3) (2024)

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