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ORCID"Extensive Laser Fault Injection Profiling of 65 nm FPGA."
Jakub Breier et al. (2017)
- Jakub Breier
, Wei He, Shivam Bhasin, Dirmanto Jap, Samuel Chef, Hock Guan Ong, Chee Lip Gan:
Extensive Laser Fault Injection Profiling of 65 nm FPGA. J. Hardw. Syst. Secur. 1(3): 237-251 (2017)
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