Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Automated Defective Pin Detection for Recycled Microelectronics ..."

Pallabi Ghosh et al. (2019)

> Home

Details and statistics

DOI: 10.1007/S41635-019-00069-7

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jhss/GhoshBFC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jhss/GhoshBFC19
Pallabi Ghosh, Aritra Bhattacharya, Domenic Forte, Rajat Subhra Chakraborty:
Automated Defective Pin Detection for Recycled Microelectronics Identification. J. Hardw. Syst. Secur. 3(3): 250-260 (2019)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.