"Investigating the influence of fidelity on the capability of a digital ..."

Shuo Su, Ben J. Hicks, Aydin Nassehi (2024)

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DOI: 10.1007/S10845-023-02144-X

access: closed

type: Journal Article

metadata version: 2024-08-04

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Shuo Su, Ben J. Hicks, Aydin Nassehi:
Investigating the influence of fidelity on the capability of a digital twin to detect material extrusion failures. J. Intell. Manuf. 35(5): 2263-2276 (2024)

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