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"Modeling Patent Quality: A System for Large-scale Patentability Analysis ..."
Shohei Hido et al. (2012)
- Shohei Hido, Shoko Suzuki, Risa Nishiyama, Takashi Imamichi, Rikiya Takahashi, Tetsuya Nasukawa, Tsuyoshi Idé
, Yusuke Kanehira, Rinju Yohda, Takeshi Ueno, Akira Tajima, Toshiya Watanabe:
Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining. J. Inf. Process. 20(3): 655-666 (2012)
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