"Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing ..."

Bin Zhou et al. (2012)

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DOI: 10.1166/JOLPE.2012.1167

access: closed

type: Journal Article

metadata version: 2020-05-22

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Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu, Bei Cao:
Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing Test Cost. J. Low Power Electron. 8(1): 73-81 (2012)

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