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"Using Bayesian networks to improve fault diagnosis during manufacturing ..."

A. Chan, Ken R. McNaught (2008)

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DOI: 10.1057/PALGRAVE.JORS.2602388

access: closed

type: Journal Article

metadata version: 2020-09-04

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A. Chan, Ken R. McNaught:
Using Bayesian networks to improve fault diagnosis during manufacturing tests of mobile telephone infrastructure. J. Oper. Res. Soc. 59(4): 423-430 (2008)

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