"Deeplab-YOLO: a method for detecting hot-spot defects in infrared image PV ..."

Ye Lei et al. (2024)

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DOI: 10.1007/S11554-024-01415-X

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type: Journal Article

metadata version: 2024-03-21

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Ye Lei, Xiaoye Wang, Aimin An, Haijiao Guan:
Deeplab-YOLO: a method for detecting hot-spot defects in infrared image PV panels by combining segmentation and detection. J. Real Time Image Process. 21(2): 52 (2024)

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