"An approach to testability analysis and improvement for VLSI systems."

Xinli Gu, Krzysztof Kuchcinski, Zebo Peng (1992)

> Home

Details and statistics

DOI: 10.1016/0165-6074(92)90358-E

access: closed

type: Journal Article

metadata version: 2020-05-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jsa/GuKP92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jsa/GuKP92
Xinli Gu, Krzysztof Kuchcinski, Zebo Peng:
An approach to testability analysis and improvement for VLSI systems. Microprocess. Microprogramming 35(1-5): 485-492 (1992)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.