"A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test."

Henry A. Bonges III et al. (1992)

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DOI: 10.1109/4.126556

access: closed

type: Journal Article

metadata version: 2025-02-03

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Henry A. Bonges III, R. Dean Adams, Archibald J. Allen, Roy Flaker, Kenneth S. Gray, Erik L. Hedberg, W. Timothy Holman, George M. Lattimore, David A. Lavalette, Kim Yen T. Nguyen, Alan L. Roberts:
A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test. IEEE J. Solid State Circuits 27(4): 649-656 (1992)

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