"Ion microbeam probing of sense amplifiers to analyze single event upsets ..."

Linda M. Geppert et al. (1991)

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DOI: 10.1109/4.68127

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type: Journal Article

metadata version: 2025-02-26

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Linda M. Geppert, Urs Bapst, David F. Heidel, Keith A. Jenkins:
Ion microbeam probing of sense amplifiers to analyze single event upsets in a CMOS DRAM. IEEE J. Solid State Circuits 26(2): 132-134 (1991)

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