"Advanced integrated-circuit reliability simulation including dynamic ..."

Wen-Jay Hsu et al. (1992)

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DOI: 10.1109/4.121545

access: closed

type: Journal Article

metadata version: 2025-02-03

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Wen-Jay Hsu, Bing J. Sheu, Sudhir M. Gowda, Chang-Gyu Hwang:
Advanced integrated-circuit reliability simulation including dynamic stress effects. IEEE J. Solid State Circuits 27(3): 247-257 (1992)

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