"Internal node probing of a DRAM with a low-temperature e-beam tester."

Keith A. Jenkins, Walter H. Henkels (1991)

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DOI: 10.1109/4.75073

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type: Journal Article

metadata version: 2025-02-26

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Keith A. Jenkins, Walter H. Henkels:
Internal node probing of a DRAM with a low-temperature e-beam tester. IEEE J. Solid State Circuits 26(4): 672-675 (1991)

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