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"A 325F2 Physical Unclonable Function Based on Contact Failure ..."
Duhyun Jeon et al. (2023)
- Duhyun Jeon
, Dongmin Lee, Dong Kyue Kim
, Byong-Deok Choi
:
A 325F2 Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio. IEEE J. Solid State Circuits 58(4): 1185-1196 (2023)
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