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"An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB."

John Keane et al. (2010)

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DOI: 10.1109/JSSC.2010.2040125

access: closed

type: Journal Article

metadata version: 2020-08-30

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  - https://dblp.org/rec/journals/jssc/KeaneWPK10
John Keane, Xiaofei Wang, Devin Persaud, Chris H. Kim:
An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB. IEEE J. Solid State Circuits 45(4): 817-829 (2010)

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