"Design of a built-in current sensor for I_DDQ testing."

Jeong Beom Kim, Sung Je Hong, Jong Kim (1998)

> Home

Details and statistics

DOI: 10.1109/4.705368

access: closed

type: Journal Article

metadata version: 2022-07-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/KimHK98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/KimHK98
Jeong Beom Kim, Sung Je Hong, Jong Kim:
Design of a built-in current sensor for I_DDQ testing. IEEE J. Solid State Circuits 33(8): 1266-1272 (1998)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.