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"A 10-Gb/s silicon bipolar IC for PRBS testing."

Oliver Kromat et al. (1998)

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DOI: 10.1109/4.654939

access: closed

type: Journal Article

metadata version: 2022-07-05

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  - journals/jssc/KromatLHH98
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  - https://dblp.org/rec/journals/jssc/KromatLHH98
Oliver Kromat, Ulrich Langmann, Gerhard Hanke, William J. Hillery:
A 10-Gb/s silicon bipolar IC for PRBS testing. IEEE J. Solid State Circuits 33(1): 76-85 (1998)

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